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FEI Inspect F

High vacuum FEG source scanning electron microscope (SEM) with EDS and WDS analysis.
EBSD crystallographic texture analysis, grain orientation and mapping
Scanning Transmission Electron Microscopy (STEM) in high-vacuum with nanometre resolution

N/A

Costs

Price per hour : tbc

Price O/N :

Contact details

Facility : NanoVision

Campus : Nanovision Francis Bancroft Building

Address : Ground Floor, Francis Bancroft Building Queen Mary University of London Mile End Road London E1 4NS

Manager : Russell Bailey

Contact : 020 7882 8469 Or 020 7882 8469

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